The University of Stellenbosch, via Howard Reader, spent time at NIST
(National Institute of Standards and Technology) with Mike Janezic on the
use of face-calibrated probes for the measurement of dielectric material
properties in the 1–3 GHz band. These results are used in the study of
microwave heating of minerals for mineral liberation. Publications of the
research will appear this year. Further work is conducted in the area of
bore-hole radar, and they have an active interest in the characterisation
of materials for wave propagation.
Main contact details are Prof J Cloete(firstname.lastname@example.org), Prof
David Davidson(email@example.com), Prof Howard
Reader(firstname.lastname@example.org), Prof. Keith
Palmer(email@example.com), Prof Petrie Meyer (firstname.lastname@example.org).
The Computational Electromagnetics Research Group within the School of
Electrical and Information Engineering consists of Prof A.R.Clark
(email@example.com), and is mainly concerned with the
improvement of the theory behind the simulation package SuperNEC.
At present, I have work based on MBPE (Model-Based Parameter Estimation),
improvements for Ray-tracing algorithms for UTD (Uniform Theory of
Diffraction), and hybridising FEM (Finite Element Method) with the MoM
(Method of Moments) for the purpose of modelling Dielectric slabs. Although
2005 produced 4 M.Sc's, no publications were produced.
Annual Reports of the group are compiled in September and are all to be
found on the sitewww.ee.wits.ac.za/~em, or
South African Publications in the field of Commission B—2005
G Mayhew-Ridgers, J W Odendaal, and J Joubert.
Efficient full-wave modelling of patch antenna arrays with new
single-layer capacitive feed probes.
IEEE Transactions on Antennas and Propagation,
53(10):3219–3228, Oct 2005.
J W Odendaal, J Joubert, and M J Prinsloo.
Extended edge wave diffraction model for near-field directivity
calculations of horn antennas.
IEEE Transactions on Instrumentation and Measurement,
54(6):2469–2473, Dec 2005.
J P Jacobs, J Joubert, and J W Odendaal.
Effect of back plane distance on mutual coupling between cpw-fed
slots on conductor-backed two-layer substrates.
IEE Electronics Letters, 47(5):407–409, Dec 2005.